WEBFOREWORD. This standard is approved for use by all Departments and Agencies of the Department of Defense. This issue of MIL–STD–883 series establishes uniform test …
WEBThe purpose of this test is to assess the structural quality of deposited dielectric films (e.g., CVD, sputtered or electron beam evaporated glass or nitride, etc.) over aluminum …
WEBMIL-STD-883 set the standards for tests for microelectronic devices suitable for use within Military and Aerospace electronic systems. It includes basic test processes to determine …
WEBThe implied leak rate that is measured on the detector for a given package using the specified conditions and employing a specified test medium (tracer gas) specific to that …
WEB1. PURPOSE. This method provides a means of judging the quality and acceptability of device interconnect metallization on non-planar oxide integrated circuit wafers or …
WEB1. PURPOSE. The purpose of this test is to check the internal materials, construction, and workmanship of microcircuits for compliance with the requirements of the applicable …
WEBBurn-in shall be 320 hours minimum for class level S hybrids (class K). The device should be burned in at the maximum specified operating temperature, voltage, and loading …